UN-ALS408K

Produkteigenschaften:

· Entwickelt für 32mm Big Frame Sensor

· Hervorragende optische Leistung, gleichmäßige Abbildung von Mitte und Rand

Produktinformationen: Sonderanfertigungen sind auf Anfrage möglich.

For color sorting equipments, textile and non-woven fabric surface testing, flexible packaging & large-format printing quality checking, plastic film and paper web flaw detection, flat glass and building panel surface screening, metal strip preliminary defect inspection, lumber board sorting and agricultural material sorting.

· Developed for 40mm big frame sensor

· Excellent optical performance, uniform imaging of center and edge

Product information: Custom designs are available upon request.

For inspection of lithium battery separators and coated copper & aluminum foils, high-end printing and anti-counterfeit packaging, precision testing of PCBs and 3C electronics, and surface defect detection of metal sheets and coils.

· Developed for 64mm big frame sensor
· Low distortion
· Compatible for 2K, 4K, 8K line scan camera
· Excellent optical performance, uniform imaging of center and edge

Product information: Custom designs are available upon request.

For inspection of lithium battery separators and coated copper & aluminum foils, high-end printing and anti-counterfeit packaging, precision testing of PCBs and 3C electronics, surface defect detection of metal sheets and coils, flat panel display & glass defect inspection, and dimension measurement of various rolled materials.

· Developed for 64mm big frame sensor
· Low distortion
· Compatible for 2K, 4K, 8K line scan camera
· Excellent optical performance, uniform imaging of center and edge

Product information: Custom designs are available upon request.

Artikel Eigenschaften:

1. Kompatibel für 30mm großer Formatsensor

2. große Blende mit F2.4

3. Hohe relative Beleuchtung

4. Kompatibel für 2K-4K Linien-Scan-Kamera

5. Ultra-Low Verzerrung, geringe vertikale achse chromatische Aberration

6. Vibrationsbeständig und hohe Stabilität.

Artikel Information: Benutzerdefinierte Designs sind verfügbar auf anfordern.

Laden Sie das datasheet von UN-ALS50TM42

For Semiconductor Wafer Inspection, Biomedical Imaging, Logistics Package Sorting, Wildfire Detection & Ember Monitoring, etc.

· Developed for 1.1" image format
· Wavelength: 800-1700nm
· Large Aperture, up to F2.0
· Compact and lightweight design

Produkteigenschaften:

· Hohe relative Beleuchtung und hoher Kontrast
· Geringe Verzerrung und hervorragende Eckhelligkeit

· Hohe Auflösung

· Kompatibel mit 4/3" 45MP Kamera

Produktinformationen: Sonderanfertigungen sind auf Anfrage möglich.