UN-UW001212C-16MP

For high-end PCB AOI inspection, Mini/Micro LED panel micro-defect detection, photovoltaic silicon wafer EL hidden crack inspection, narrow precision metal strip flaw detection, luxury printing anti-counterfeit texture inspection, electronic ceramic substrate microscopic inspection and high-precision linear dimension measurement of tiny electronic components.

· Developed for 66mm big frame sensor
· Low distortion
· Compatible for 16K line scan camera
· Excellent optical performance, uniform imaging of center and edge

Product information: Custom designs are available upon request.

Produkteigenschaften:

· Entwickelt für 2/3" Bildformat
· Geringe Verzerrung
· Hohe relative Beleuchtung

· Fokus und Blende mit Schraube fixiert

Produktinformationen: Sonderanfertigungen sind auf Anfrage möglich.