UN-LFA1236C-10MP

For high-end PCB AOI inspection, Mini/Micro LED panel micro-defect detection, photovoltaic silicon wafer EL hidden crack inspection, narrow precision metal strip flaw detection, luxury printing anti-counterfeit texture inspection, electronic ceramic substrate microscopic inspection and high-precision linear dimension measurement of tiny electronic components.

· Developed for 66mm big frame sensor
· Low distortion
· Compatible for 16K line scan camera
· Excellent optical performance, uniform imaging of center and edge

Product information: Custom designs are available upon request.

For semiconductor and precision electronics manufacturing inspection and alignment, new energy lithium-ion battery defect detection, ultra-thin flat panel display surface defect inspection, and high-speed printing quality inspection.

· Developed for 72mm big frame sensor

· IR correction

· Excellent optical performance, uniform imaging of center and edge

Product information: Custom designs are available upon request.